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Coating: Chromium/Platinum Overall
Tip shape: Rotated

Product Description

Rotated, monolithic silicon AFM probe with symmetric tip shape, designed for force modulation, pulsed force mode (PFM) and electric modes such as:

• scanning capacitance microscopy (SCM)

• electrostatic force microscopy (EFM)

• Kelvin probe force microscopy (KFM)

• scanning probe lithography

Coating Description

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

Full Technical Data

ElectriCont-G Electrical, Contact Mode AFM Probe

Coating: Chromium/Platinum Overall
Tip shape: Rotated

Product Description

Rotated, monolithic silicon AFM probe with symmetric tip shape for contact mode and electric modes such as:

• scanning capacitance microscopy (SCM)

• electrostatic force microscopy (EFM)

• Kelvin probe force microscopy (KFM)

• scanning probe lithography

Coating Description

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.