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NanoWorld
Product Description
NanoWorld Pointprobe? NCH probes are designed for non-contact or tapping? mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe? series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
For measurements on samples with sidewall angles approaching 90° we offer specially tailored tips showing a high aspect ratio portion with near-vertical sidewalls.
These probes offer unique features:
length of the high aspect ratio portion of the tip > 1.5 μm
typical aspect ratio of this portion in the order of 12:1 (when viewed from side as well as along cantilever axis)
half cone angle of the high aspect ratio portion typically < 2.8°
excellent tip radius of curvature
Coating Description
Aluminum Reflex Coating
The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.
Full Technical Data
